التكنولوجيا وأخبارها بوابة الإمارات لتكنولوجيا المعلومات والإتصالات
JEOL: Release of the New Scanning Electron Microscope JSM-IT700HR
SEM – Essential in Daily Lab Operation – JSM-IT700HR Makes it Easy
JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi)
announces the release of a new scanning electron
microscope (SEM), the JSM-IT700HR for unprecedentedly
high throughput in August 2020.
Development background
Scanning electron microscopes are used in various fields,
such as nanotechnology, metals, semiconductors, ceramics,
medicine, and biology. In addition, SEM applications are
expanding to include quality control as well as basic
research. The demands are increasing for faster data
acquisition of higher-quality SEM images and for easier
confirmation of compositional information.
Based on our award-winning predecessor of
“InTouchScope™” series SEMs, the JSM-IT700HR is
equipped with our in-lens Schottky field emission electron
gun (FEG). This new powerful SEM satisfies the needs for
observation and analysis of further miniaturized materials
in daily laboratory operation.
The JSM-IT700HR delivers a high resolution of 1 nm and a
maximum probe current of 300 nA (15 times higher than
previously), providing a wealth of observation and analysis
information. A simple-to-operate user interface, the
compact design accommodating a large specimen chamber,
with a renewed anti-vibrational support for the main
console achieve more comfortable observation and analysis
than before.
For enhancing “Simple operation,” the JSM-IT700HR
incorporates a new function, integrated into the SEM GUI,
to display the characteristic X-ray generation depth. This
supports prompt understanding of the analysis depth
(reference) for the specimen, which is useful for elemental
analysis.
2 configurations are available, 1) JSM-IT700HR/LV for high
and low vacuum image observation, 2) JSM-IT700HR/LA
with additional integrated JEOL EDS system.
Features
- The in-lens Schottky field emission electron gun allows for high-definition image observation and high spatial-resolution analysis.
- The Zeromag function, which links Holder Graphics, CCD and SEM images, makes specimen navigation easier than ever.
- With our “Analytical series” (Live Analysis function), the embedded EDS system shows a real-time EDS spectrum during image observation for efficient elemental analysis.
- A new function to display the analysis depth (characteristic X-ray generation depth) supports fast elemental analysis.
- SMILE VIEW™ Lab, enabling integrated management of image and analysis data, facilitates report generation for all data from collected SEM images to elemental analysis results.
- “Specimen Exchange Navi” enables safe and simple specimen exchange.
- With the Auto Beam Alignment function, the electron optical conditions are always kept optimum.
- “Drawout exchange system” allows easy access to the large specimen chamber, which accommodates
- various sizes and types of specimens
