أرشيف الوسم : a new atomic resolution analytical electron microscope

JEOL: Release of a New Ultrahigh Atomic Resolution Analytical Electron Microscope JEM-ARM300F2 (GRAND ARM(TM)2

JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new atomic resolution analytical electron microscope, JEM-ARM300F2 (GRAND ARM(TM)2) to be released in February 2020. Product development background In Electron Microscopy, a great number of microscopists and engineers have continued to pursue the improvement of resolution. Meanwhile, …

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